- electron-beam column
- electron-beam column Elektronen(strahl)säule f
English-German dictionary of Electrical Engineering and Electronics. 2013.
electron-beam column
Schlagen Sie auch in anderen Wörterbüchern nach:
Electron beam welding — (EBW) is a fusion welding process in which a beam of high velocity electrons is applied to the materials being joined. The workpieces melt as the kinetic energy of the electrons is transformed into heat upon impact, and the filler metal, if used … Wikipedia
Electron Beam Prober — The Electron Beam Prober (E beam Prober) is a specialized adaption of a standard Scanning Electron Microscope (SEM) that is used for semiconductor failure analysis. While a standard SEM may be operated in a voltage range of 25KeV to 30KeV, the E… … Wikipedia
Electron diffraction — is a technique used to study matter by firing electrons at a sample and observing the resulting interference pattern. This phenomenon occurs due to the wave particle duality, which states that a particle of matter (in this case the incident… … Wikipedia
Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… … Wikipedia
Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs … Wikipedia
Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors … Wikipedia
Photoemission electron microscopy — (PEEM, also called photoelectron microscopy, PEM) is a widely used type of emission microscopy. PEEM utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by UV light, synchrotron radiation… … Wikipedia
Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F … Wikipédia en Français
High-resolution transmission electron microscopy — (HRTEM) is an imaging mode of the transmission electron microscope (TEM) that allows the imaging of the crystallographic structure of a sample at an atomic scale. [cite book |title=Experimental high resolution electron microscopy |last=Spence… … Wikipedia
Ion Beam Mixing — is a process for adhering two multilayers, especially a substrate and deposited surface layer. The process involves bombarding layered samples with doses of ion radiation in order to promote mixing at the interface, and generally serves as a… … Wikipedia
Phase-contrast imaging — Phase contrast imaging, or – more casually – High Resolution (HR) imaging, is a method of imaging in Transmission Electron Microscopy (TEM). The ability to image using phase contrast is one of the key elements which differentiates Transmission… … Wikipedia
